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X-Ray Fluorescence Spectrometry (XRF)
Description of Technique
X-ray fluorescence spectrometry (XRF) is a nondestructive
method for the elemental analysis of solids and liquids using a x-ray beam. The
sample is irradiated which causes the emission of fluorescent x-rays to emerge
from the sample. The x-rays are collected and displayed in a spectrum with
either an energy dispersive or wavelength dispersive detector. The elements in
the sample are identified by the wavelengths (qualitative) of the emitted x-rays
while the concentrations of the elements are determined by the intensity of
those x-rays (quantitative). XRF is a bulk analysis technique with the
depth of sample analyzed varying from less than 1mm to 1cm depending on energy
of the emitted x-ray and the sample composition. The elemental detection is from
sodium to uranium.
Uses
 Used
for bulk quantitative and qualitative elemental analysis on samples of solid,
powders, and liquids.
Quantitative
elemental data is given in ppm to weight percentage concentrations.
Standards can be generated.
Qualitative
data - elements from boron to uranium
Gideon Analytical Labs 80 Loughran Ln Highland NY 12528-2838
845-255-5356 info@gideonlabs.com | 