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X-Ray Diffraction

X-ray diffraction (XRD) takes advantages of the coherent scattering of x-rays by polycrystalline materials to obtain a wide range of structural information. The x-rays are scattered by each set of lattice planes at a characteristic angle, and the scattered intensity is a function of the atoms which occupy those planes. The scattering from all the different sets of planes results in a pattern which is unique to a given compound. In addition, distortions in the lattice planes due to stress, solid solution, or other effects can be measured. An additional advantage of XRD is that it is a non-destructive technique, and that there are no requirements on the sample other than its surface be planar and that it be polycrystalline.

	Both quantitative and qualitative data can be obtained. Quantitative analysis requires that the customer supply reference standards of the individual constituents in the mixture.
	Inorganic compounds which have known reference patterns. Limited capabilities for structure determination of compounds whose crystal structure is unknown.
	Degree of preferred orientation of textured materials
	Residual Stress
	Average crystallite size can be measured for materials whose average crystallite size is less than 300mm

  Degree of crystallinity can be quantified for materials which are only partially crystalline

Gideon Analytical Labs  80 Loughran Ln Highland NY 12528-2838      845-255-5356   info@gideonlabs.com 

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