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Probe Station and Electrical Testing

The standard hourly lab rate for construction (CA) and failure analysis (FA) includes instrumentation used for the photographs from cameras (4X to 2000X), use of probe station and curve tracer (probing circuits on the chip), oscilloscope, liquid crystal, polishing equipment tables, and saws and all the instruments marked with an asterisk *. We can delayer the chip, enhance the junctions, inspect visually, look for chip defects, cross section the chip, determine the plating thickness, and test for fine and gross leaks. We can enhance metallurgy for grain structure and boundaries, and stain to distinguish layers.

 

 

 

Gideon Analytical Labs  80 Loughran Ln Highland NY 12528-2838     845-255-5356   info@gideonlabs.com   

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