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Through component failure analysis
and failure analysis performed on other levels, we can identify
the problem area. Was the failure caused by an application problem? A design
problem? A process problem? A mechanical problem? Materials incompatibility? A quality issue
associated with component manufacturing? Or is the failure an end of life wear
out mechanism? These are questions we answer through failure analysis and
component failure analysis.
Gideon Labs performs failure
analysis on discrete electrical components: capacitors (film, tantalum,
electrolytic, ceramic, disc, polarized, ac, dc, etc.), relays (solid state,
mechanical, electromechanical, mercury, current, blind, track) PWB
(contamination, ions, IPC 650, cross sections, tin migration, PTH opens),
transformers (power, isolation, current, voltage, signal, flyback, oil, pulse,
step up and down, high and low voltage, high frequency), resistors, fans, cable,
connectors, and semiconductors (diodes, FETs, PWMs, oscillators, thyristers,
SCRs, rectifiers, interconnect and packaging problems, etc). The component list
is unduly long to mention all the components we have analyzed.
- Relays
| Solid
State |
AC |
Track |
Reed |
| Mercury |
DC |
Electromechanical |
Timer |
| Current |
Blind |
Voltage |
Open
Latching |
- Capacitors
| Tantalums |
Polarized |
High
Frequency |
Bypass |
Surge |
| Electrolytics |
Coupling |
High
Voltage |
Non
polarized |
AC
and DC |
| Film |
Oil |
Trimmer |
Surface
Mount |
Metal
film |
| Ceramic |
Pulse |
Wet
tantalum |
Snubber |
Doublers |
- Reliability and measurements of
capacitors
| Electrical
Capacitance vs voltage |
Forming
voltage |
Crystallization |
| Capacitance |
ESR |
Staining |
| Chemical
and thermal conversion efficiency |
IR |
polarization
determination |
- Single
Crystal Oscillators
| Frequency Range |
Point Defects |
package defects |
| Faults |
Line Defects |
Lattice Defects |
| milling defects |
Pierce |
Clapp |
- Converters
| 3 phase bridge rectifiers
|
Dielectric constants
|
Construction
|
| DC to DC
|
- Solder fatigue
|
Failure analysis
|
| AC to DC
|
Reliability issues
|
Insulation resistance
|
- Magnetics
- Inductors
|
Crystallography using X-Ray
diffraction
|
High pot testing to Underwriters
Laboratories (UL) specifications
|
| Power and pulse transformers
|
Collapsing characteristics of
different ferrite materials
|
Delay lines (magnetic and sonic)
|
| Qualification of ferrite core
|
50 and 60 cycles/sec
|
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- CRT Testing
- Phosphor evaluations (decay times, size, texture, crystallography, chemical
identification)
- Resistors
| Thin film
|
Carbon
|
Snubber
|
| Thick film
|
Ceramic
|
Potentiometers
|
| Fusible
|
Evaporated
|
Wire wound
|
- Fans
| Testing
|
Greases identified
|
Materials ID |
| Motor longevity
|
Bearing seals
|
High reliability |
- Wires
| Bulk wire
|
Ribbon cable and flat cable
|
AC
line cords
|
| Line cords
|
- Harmonized AC line cords for international applications
|
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- Semiconductors
| FETs (MOSFETS,
JFETS) |
Bridges Rectifiers
|
Transistors
(Mesa, planar, BP, IGBT)
|
Comparators |
Thermistor |
| Rectifiers
|
Pulse Width Modulators
(PWMs)
|
- Diodes (silicon, germanium,
zener,
schottky)
|
Optocouplers, photodiode,
photo transistors |
Thyristors |
| SCRs
|
Voltage Regulators |
Hall Sensors |
EOS/ ESD |
Monolithic |
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- Gideon Analytical Labs 80 Loughran Ln Highland NY 12528-2838
845-255-5356 info@gideonlabs.com
Resistors Magnetics
Capacitor Fans Wires
Oscillators Converters
Relays
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