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Oscilloscope on Sample 1

NEC Inverter Board

Gideon Analytical Laboratories received three sample NEC 104PW161 power inverter boards for failure analysis.  A power inverter is designed to convert direct current (DC) to alternating current (AC).  Inverters are used to operate all types of electrical equipment that uses batteries.  DC current is what batteries store, but most electrical devices need AC current.  These NEC 104PW161 [...]

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SEM micrograph

LCD analysis

Gideon Analytical Laboratories received several liquid-crystal displays (LCDs) that had fading issues; there were five failing LCDs and a good LCD for comparison.  An LCD is a flat panel display, electronic visual display, or video display that uses the light modulating properties of liquid crystals.  LCDs are extremely common in electronic devices such as laptops, digital clocks [...]

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Everlight wire bonds on die

Moisture Ingress Test

Gideon Analytical Laboratories received 10 parts each of Everlight and Nichia, respectively, LED components to on which to perform a moisture ingress comparison.  An LED (light-emitting diode) is a semiconductor light source that uses an anode, a cathode, and a die to direct electrons to release energy in the form of protons.    A moisture ingress [...]

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Part of package removed from body

Surface Mount Tantalum Capacitors

Gideon Analytical Laboratories received two surface mount (SM) tantalum capacitors that had internal resistive shorts.  Capacitors are passive, two-terminal electrical components used to store energy.  They vary in construction, but all have at least two electrical conductors that are separated by an insulator, known as a dielectric.  Tantalum capacitors are a type of electrolytic capacitor, which [...]

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    • Analytical Services
      • Ion Chromatograph Analysis
      • Moisture Ingress Testing
    • Application Issue
    • Component Failure Analysis
      • Capacitor Failure Analysis
        • Electrolytic Capacitor Failures
        • Film Capacitor Failure Analysis
        • MLCC Failure Analysis
        • Tantalum Capacitor Failure Analysis
      • Connector Failure Analysis
      • Oscillator Failure Analysis
      • Potentiometer Failure Analysis
      • Relay Failure Analysis
      • Resistor Failure Analysis
      • Semiconductor Failure Analysis
        • Diode Failure Analysis
        • Failure Analysis of Op-Amp
        • Failure Analysis of Transistors
        • FET Failure Analysis
        • IGBT Failure Analysis
        • Laser Failures
        • Optical Coupler Failure Analysis
        • Phototransistor Failure Analysis
        • Power Amplifier Failure Analysis
        • PWM Failure Analysis
        • Rectifier Failure Analysis
        • Triac Failure Analysis
        • Voltage Regulator Failure Analysis
      • Stranded Wire Failure Analysis
      • Tranformer Analysis
    • Contamination Analysis
    • Failure Analysis
    • FTIR
    • IC Failure Analysis (Integrated Circuit)
    • Inorganic Analysis
    • Organic Analysis
    • Power Supply Failures
    • Printed Circuit Board Analysis
      • BGA Failure
      • Contamination Analysis on PCB
      • Cross-sections of components on PCBs
      • Fires
      • Flex circuits
      • PCB Failure Analysis
      • PCB Qualification
      • PCB Quality Control
    • Success Stories